User contributions for DanerAbdula
A user with 20 edits. Account created on 20 October 2008.
9 March 2009
- 02:1202:12, 9 March 2009 diff hist +32 N Defect scattering moved Defect scattering to Carrier scattering: Added scattering due to phonons, in addition to the original treatment of defects. current
- 02:1202:12, 9 March 2009 diff hist 0 m Carrier scattering moved Defect scattering to Carrier scattering: Added scattering due to phonons, in addition to the original treatment of defects.
- 02:1002:10, 9 March 2009 diff hist +5,440 Carrier scattering No edit summary
7 December 2008
- 00:0200:02, 7 December 2008 diff hist +14 Carrier scattering No edit summary
6 December 2008
- 05:4605:46, 6 December 2008 diff hist +28 Carrier scattering No edit summary
- 05:0505:05, 6 December 2008 diff hist +1,565 Carrier scattering No edit summary
4 December 2008
- 04:0004:00, 4 December 2008 diff hist +16 Carrier scattering No edit summary
26 November 2008
- 17:5117:51, 26 November 2008 diff hist +930 Carrier scattering No edit summary
- 07:0207:02, 26 November 2008 diff hist 0 Carrier scattering No edit summary
- 07:0007:00, 26 November 2008 diff hist +10,138 N Carrier scattering ←Created page with 'Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity...'
23 October 2008
- 05:5305:53, 23 October 2008 diff hist +1,982 Chemical force microscopy No edit summary
- 03:5903:59, 23 October 2008 diff hist +25 Friction force microscope ←Redirected page to Chemical force microscopy#Frictional Force Mapping
- 03:5803:58, 23 October 2008 diff hist +40 Friction force microscope ←Redirected page to Chemical force microscopy
21 October 2008
- 02:0602:06, 21 October 2008 diff hist +26 Chemical force microscopy No edit summary
- 01:5701:57, 21 October 2008 diff hist −2 Chemical force microscopy No edit summary
- 01:5101:51, 21 October 2008 diff hist +51 Chemical force microscopy No edit summary
20 October 2008
- 07:0307:03, 20 October 2008 diff hist +10,132 N Chemical force microscopy ←Created page with 'Chemical force microscopy, CFM, is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces. Wi...'
- 03:0203:02, 20 October 2008 diff hist +162 Wikipedia:Help desk →Autoconfirmation: new section
