File:Scanning thermal microscopy tip.jpg

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Description (a) Schematic of the experimental set-up, in which a Au-coated SThM probe (cross-sectional view) is brought into close proximity of a heated Au substrate. The tunnelling current across the nanogap is monitored by applying d.c. or a.c. voltages. Simultaneously, the thermoelectric voltage (Vth) generated by the Au–Cr thermocouple is recorded to monitor the temperature of the probe’s tip. The diagram on the right shows the thermal resistance network representing the heat flow from the substrate, through the nanogap, to the probe. (b) SEM image showing the top view of a SThM probe. (c,d) SEM images of the probe and its tip, which has a diameter of ∼300 nm.
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Source http://www.nature.com/articles/ncomms14479
Author Longji Cui, Wonho Jeong, Víctor Fernández-Hurtado, Johannes Feist, Francisco J. García-Vidal, Juan Carlos Cuevas, Edgar Meyhofer & Pramod Reddy
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current04:29, 16 March 2017Thumbnail for version as of 04:29, 16 March 20172,262 × 1,668 (151 KB)Materialscientist{{Information |Description=(a) Schematic of the experimental set-up, in which a Au-coated SThM probe (cross-sectional view) is brought into close proximity of a heated Au substrate. The tunnelling current across the nanogap is monitored by applying d.c...
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